Waygate Technologies delay line transducers are single beam units that are designed for use with the GE Inspection Technologies USM Go flaw detector. These transducers incorporate a short plastic waveguide or delay line between the active element and the test piece which improves near surface resolution as well as protects the active element from thermal damage in high temperature testing. The delay lines are replaceable to increase versatility and lifespan of the transducer. A layer of couplant is required between the transducer and the material being tested. Waygate Technologies delay line transducers are ideal for near surface flaw detection, thickness measurement, inspection of thin sections, curved parts (including tubing and pipe), composites and plastics, and turbine blades.