The 2650 Series [2657A] High Power SourceMeter SMU Instruments are designed specifically for characterizing and testing high voltage/current electronics and power semiconductors, such as diodes, FETs, and IGBTs, high brightness LEDs, DC-DC converters, batteries, solar cells, and other high power materials, components, modules, and subassemblies. They deliver unprecedented power, precision, speed, flexibility, and ease of use to improve productivity in R&D, production test, and reliability environments. Two instruments are available offering up to 3000V or up to 2000W of pulse current power.
Source or sync up to 180W of DC or pulsed power (+/-3000V@20mA, +/-1500V@120mA)
1fA low current resolution
Dual 22-bit precision ADCs and dual 18-bit 1µs per point digitizers for high accuracy and high speed transient capture
Fully TSP compliant for easy system integration with Series 2600B System SourceMeter models
Combines a precision power supply, current source, DMM, arbitrary waveform generator, V or I pulse generator, electronic 18-bit load, and trigger controller-all in one instrument
Includes TSP® Express characterization software, LabVIEW driver, and Keithley's Test Script Builder software development environment
Applications:
Power semiconductor device characterization and testing
Characterization of GaN, SiC, and other compound materials and devices
Breakdown and leakage testing to 3 kV
Characterization of sub-millisecond transients
Specifications
(1) Single-Channel High Power SourceMeter SMU Instrument
(1) Digital I/O and Interlock Connector (7709-308A)