Options 0 Item Selected
Image
Model
Product Name
Price
Available
Quantity
Chauvin Arnoux CA 6549 [P01139713] 500V / 1000V / 2500V / 5000V Insulation Tester
P01139713
Rp.131,587,456
4 - 6 WEEKS
Chauvin Arnoux CA 6505 [P01139714] 500V / 1000V /2500V / 5000V Insulation Tester
P01139714
Rp.85,254,940
4 - 6 WEEKS
Chauvin Arnoux CA 6545 [P01139711] 500V / 1000V / 2500V / 5000V Digital Insulation Resistance Tester
P01139711
Rp.95,985,718
4 - 6 WEEKS
Chauvin Arnoux CA 6547 [P01139712] 500V / 1000V / 2500V / 5000V Insulation Tester
P01139712
Rp.117,210,752
4 - 6 WEEKS
  Accessories 0 Item Selected
×
Multiple Product

have been added to your cart

There Are items in your cart.

Cart Subtotal: $xxx.xx

Go to checkout

Chauvin Arnoux CA 6549 [P01139713] 500V / 1000V / 2500V / 5000V Insulation Tester

Not yet rated Write a review
Rp.131,587,456
Availability:
4 - 6 WEEKS
Product Code:
P01139713
Brand:
Chauvin Arnoux
Update Terakhir:
26 Feb 2023
  • Free delivery

  • Money back guarantee

Share

Chauvin Arnoux CA 6549 [P01139713] 500V / 1000V / 2500V / 5000V Insulation Tester . The best overall model in Chauvin Arnoux's range of 6500 megohmmeters, this device includes everything found on the other meters in the range plus a few additional functions exclusive to this unit. This device is a multifunctional measurement tool that can be used to carry out measurement of insulation resistance, voltage, capacitance and leakage current across a wide range. It is a device that is made for use in evaluating high voltage systems and can measure insulation resistance up to 10TΩ, voltage up to 5100V, capacitance from 49.99F and leakage current up to 3000A. In addition to these standard measurements the CA6549 can also be used to calculate polarisation index (PI), dielectric absorption ratio (DAR) and dielectric discharge index (DD) in order to maintain testing accuracy when carrying out long term testing. The CA6549 also includes programmable alarms, built-in memory, a step voltage function which will adjust the test voltage automatically over a time period, programmable testing duration, R(t) graph, a smoothing function to make unstable readings stable and a reference temperature function.

Write a review