SADT HARTIP 3210 [HARTIP3210] Leeb Portable Hardness Tester with Probe E and High Accuracy

HARTIP 3210 is a new generation of Leeb hardness tester with more advanced technology and features. The tester applies our new patent dual-coil sensor technology which makes the tester more accurate than old previous model. All impact device (probe) are no need to setup impact direction. HARTIP 3210 can work with both analogy impact device and wireless RF probe.

The measuring values can be downloaded to PC and printer by wireless or by cable. The HARTIP 3210 also can be powered by USB power supply without battery via PC cable.

MEASURING METHOD
The measuring principle of HARTIP series hardness testers is defined as "the quotient of the impact body's rebound and impact velocity, multiplied by 1000." An impact body with a Tungsten Carbide test tip is propelled by spring force against the test surface and then rebounds back. A permanent magnet is contained within the impact body. When it passes through the coil on impact device, it induces an electric voltage which is proportional to the velocity of the impact body.