Special, lower current version of the Seaward Cropico DO5000 digital micro ohmmeter.
Suitable for use on production lines or as a testing tool in the lab, the Cropico DO5002 is a mains-powered solution for testing low resistance levels from 200mΩ to 30kΩ with up to 10mΩ resolution. The test current of the DO5002 is fully user programmable in steps from 10 to 100% (1% steps) across a range of 10μA to 10A. All results are highly accurate since the DO5002 uses a 4 terminal measurement technique to filter out test lead resistance errors.
The DO5002 is capable of logging testing data directly in its built-in memory; you can store up to 4000 individual time and date stamped records on the instrument. A built-in suite of statistical analysis tools is also included, allowing you to calculate MIN/MAX, average, peak-to-peak and standard deviation using your stored results.
A wide variety of extra features are included on the DO5002; see below for a comprehensive breakdown of this unit's capabilities Features:
High accuracy digital micro ohmmeter suitable for use in a wide variety of applications ranging from production lines to laboratories
Reliable accurate results - test lead resistance errors are filtered out thanks to true 4 terminal measurements
Wide measurement range from 200mΩ to 30kΩ
Excellent resolution as low as 10 micro ohm
True zero capabilities
Digital calibration
Autimatic temperature compensation with programmable coefficients
Open circuit lead warning
Variable current range from 10μA to 10mA
Programmable current - 1% steps from 10 to 100%
Highly accurate measurements within 0.03%
Fast measurement capability - up to 50 measurements per second in fast measurement mode
Programmable high and low limits with red/green lamps on front panel
Open circuit voltage limit mode - 20mV/50mV maximum
Measuring current selection with auto average
Datalogging capabilities - store up to 4000 time and date stamped records in internal memory
Perform statistical analysis on stored records - includes MAX/MIN, average, peak-to-peak and standard deviation