ElektroPhysik MikroTest F 5 [80-638-0001] Banana Gauge, Manual Coating Thickness Gauge, 0 - 1000 micron - MIK/010110

Name: ElektroPhysik MikroTest F 5 [80-638-0001] Banana Gauge, Manual Coating Thickness Gauge, 0 - 1000 micron - MIK/010110
Brand: PT. Indomultimeter Test Instrument
Availability: OutOfStock
Rating: 5 (1 reviews)

ElektroPhysik MikroTest F 5 [80-638-0001] Banana Gauge, Manual Coating Thickness Gauge, 0 - 1000 micron - MIK/010110

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Tags: Additel , Digital , Pressure , Calibrators

Description

The ElektroPhysik MikroTest F 5 [80-638-0001] is a manual, magnetic coating thickness gauge designed for quick, precise, and non-destructive measurement of non-magnetic coatings on steel. The MikroTest is the most widely used coating thickness gauge in the world over the last 40 years. The MikroTest complies with the highest technical standards of all analogue magnetic coating thickness gauges. This magnetic coating thickness gauge works on the magnetic attraction principle to measure all non-magnetic coatings on steel and galvanic nickel on steel. The MikroTest is supplied in 11 different models to be suitable for every requested application. The balanced measuring system ensures accurate readings at any angle: horizontal, vertical and overhead. Also, the gauge allows measurements on curved surfaces. It is also able to provide you with precise measurements in tubes and on round parts due to the automatic operation. The measurement of the coating thickness is based on magnetic attraction. The attractive force is related to the distance between a permanent magnet and a steel substrate. This distance represents the thickness of the coating under measure. The magnet is lifted from the surface by means of a spring connected to the magnet arm. The force needed to lift the magnet is directly related to the angle of rotation of the torsion spring. This measuring principle is also especially suited for electroplated nickel on copper, aluminum and other non-ferrous metals. This measurement principle ensures fully automatic measurement where no power supply or calibration is required.