The Ossila Four-Point Probe System is part of the Institute of Physics award-winning Solar Cell PrototypingPlatform*. It is a low-cost solution for rapid and reliable measurement of the sheet resistance, resistivity, andconductivity of materials.The system includes a four-point probe, source measure unit, and easy-to-use PC software — enabling morelaboratories to measure sheet resistance for an affordable price. The probe head uses gentle spring-loadedcontacts instead of sharp needles, minimising damage to delicate samples (e.g. polymer films that are only afew nanometres thick).The system is operated via the specifically-designed PC software, which automatically calculates appropriategeometrical correction factors for the sample to give accurate values for the sheet resistance. If the samplethickness is provided, the software will further calculate resistivity and conductivity.
*The Ossila Solar Cell Prototyping Platform is a complementary collection of substrates, materials, and equipment as part of a high-performance standard photovoltaic reference architecture. This platform enables researchers to produce high-quality, fully-functional solar cells which can be used as a reliable baseline.